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An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)
An Introduction to Mixed-Signal IC Test and Measurement (The Oxford Series in Electrical and Computer Engineering)

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Manufacturer: Oxford University Press
Publisher: Oxford University Press
Author(s): Gordon Roberts, Friedrich Taenzler, Mark Burns

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Product Description:
Binding: Hardcover
EAN: 9780199796212
Edition: 2
ISBN: 0199796211
Item Dimensions: Array
Label: Oxford University Press
Languages: Array
Manufacturer: Oxford University Press
Number Of Items: 1
Number Of Pages: 864
Publication Date: 2011-10-14
Publisher: Oxford University Press
Studio: Oxford University Press
Editorial Review:
With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal, and radio-frequency circuits, today's engineer must be fluent in all four circuit types. Written for advanced undergraduate and graduate-level students, as well as engineering professionals, An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, encompasses analog, mixed-signal and radio-frequency circuits tests, with many relevant industrial examples. The text assumes a solid background in analog and digital circuits and a working knowledge of computers and computer programming.

An Introduction to Mixed-Signal IC Test and Measurement, Second Edition, includes examples and illustrations--featuring state-of-the-art industrial technology--to enrich and enliven the text. The book also introduces large-scale mixed-signal circuit and individual circuit tests, discusses the value-added benefits of mixed-signal IC testing to a manufacturer's product, and clearly defines the role of the test engineer.

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